Domestic EDA technology pioneer | PFTN semiconductor
One-Stop Shop for Manufacturering EDA
Process and Device Simulation (TCAD)
TCAD and beyond for the hetero integration systems in the post-Moore era.
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DTCO in advanced logic technologies
Path-finding and optimization for performance, power, area, cost and yield
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Total Ionizing Dose Effect in CMOS
Total Ionizing Dose (TID) effect is one of the prominent effects on irradiated semiconductor devices
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Cogenda made its appearance at CSE2025& Jiufengshan Forum and was invited to share a report
Shared the title "3D Electrical-optical Fully Coupled TCAD Simulation for SiGe Photo Detector"
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Process and Device Simulation (TCAD)
TCAD and beyond for the hetero integration systems in the post-Moore era.
Lithography and OPC
Higher resolution, better fidelity and denser integration
Compact Modeling
Bridge between device and circuit design
Foundation IP
Readily available circuit building blocks
NEWS
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Cogenda made its appearance at CSE2025& Jiufengshan Forum and was invited to share a report
Shared the title "3D Electrical-optical Fully Coupled TCAD Simulation for SiGe Photo Detector"
Pengfeng Tunan Launches Next-Generation Virtual Manufacturing Process Simulation Software Mozz Emulator
Empowering Semiconductor Process Simulation Towards a Future of Higher Precision and Efficiency
Total Ionizing Dose Effect in CMOS
Total Ionizing Dose (TID) effect is one of the prominent effects on irradiated semiconductor devices
